TP200 TOUCH TRIGGER PROBE
TP200/TP200B modular probes
The TP200 and TP200B are electronic probes using strain gage technology which gives higher accuracy than kinematic touch-trigger probes. They combine outstanding metrology performance with superior
functionality to produce a highly versatile DCC CMM probing system with excellent productivity.
The TP200 system components are:
- TP200 probe body – the standard model
- TP200B probe body – a variant model with increased vibration tolerance
- TP200 stylus module – choice of fixed overtravel forces: ‘SF’ (standard force), ‘LF’ (low force) or EO (extended overtravel)
- PI 200-3 probe interface (included in Helmel Kits)
- SCR200 stylus changing rack
TP200 probe body
The TP200 probe incorporates micro strain gage transducers delivering excellent repeatability and accurate 3D form measurement even with long styli. The sensor technology gives sub-micron triggering
performance and eliminates the lobing characteristics encountered with standard probes. The solid state ASIC electronics within the probe ensure reliable operation over millions of trigger points.
TP200B probe body
The TP200B probe uses the same technology as TP200 but has been designed to have a higher tolerance to vibration. This helps to overcome the problem of ‘air’ trigger generation which
can arise from vibrations transmitted through the CMM or when using longer styli with faster positioning speeds. Please note that we do not recommend the use of TP200B with the LF module or cranked/star styli.
|Principal application||DCC CMM where high accuracy measurement is required||As TP200 but where ‘air’ * trigger events occur|
|Sense directions||6-way (±X, ±Y, ±Z)||6 way (±X, ±Y, ±Z)|
|Unidirectional repeatability (2σ μm)||Trigger level 1 Trigger level 2||0.4 μm (0.000016 in) 0.5 μm (0.000020 in)||0.4 μm (0.000016 in) 0.5 μm (0.000020 in)|
|XY (2D) form measurement deviation||Trigger level 1 Trigger level 2||±0.8 μm (0.000032 in) ±0.9 μm (0.000036 in)||±1.0 μm (0.000040 in) ±1.2 μm (0.000047 in)|
|XYZ (3D) form measurement deviation||Trigger level 1 Trigger level 2||±1.0 μm (0.000040 in) ±1.4 μm (0.000056 in)||±2.5 μm (0.000100 in) ±4.0 μm (0.000160 in)|
|Repeatability of stylus change||With SCR200 Manual||±0.5 μm (0.000020 in) max ±1.0 μm (0.000040 in) max||±0.5 μm (0.000020 in) max ±1.0 μm (0.000040 in) max|
|Trigger force||XY plane Z axis||All modules All modules||0.02 N 0.07 N||0.02 N 0.07 N|
|Overtravel force (@ 0.5 mm displacement)||XY plane Z axis||SF/EO module LF module SF/EO module LF module||0.2 N – 0.4 N 0.1 N – 0.15 N 4.9 N 1.6 N||0.2 N – 0.4 N 0.1 N – 0.15 N 4.9 N 1.6 N|
|Weight (probe sensor + module)||22 g (0.8 oz)||22 g (0.8 oz)|
|Max. extension (if on PH10 series head)||300 g (11.8 oz)||300 g (11.8 oz)|
|Max. recommended stylus length (M2 stylus range)||SF/EO module LF module||50 mm (1.97 in) steel – 100 mm (3.94 in) GF 20 mm (0.79 in) steel – 50 mm (1.97 in) GF||50 mm (1.97 in) steel – 100 mm (3.94 in) GF 20 mm (0.79 in) steel – 50 mm (1.97 in) GF|
|Probe mounting method||M8 thread||M8 thread|
|Suitable interface||PI 200-3||PI 200-3|
|Stylus module changing rack (automatic)||SCR200||SCR200|
|Stylus module storage rack (manual)||MSR1||MSR1|
|The above data applies for test conditions as follows: Stylus length 50 mm (1.97 in) Stylus velocity 480 mm/min (1.57 ft/min)||
* Air trigger (or false trigger). The TP200B reduces triggers that may be caused by vibrations.